By Susan Brooks(eds.)

ISBN-10: 0470518510

ISBN-13: 9780470518519

ISBN-10: 111997884X

ISBN-13: 9781119978848

The publication is worried with the speculation, historical past, and functional use of transmission electron microscopes with lens correctors which may right the consequences of round aberration. The booklet additionally covers a comparability with aberration correction within the TEM and functions of analytical aberration corrected STEM in fabrics technological know-how and biology. This booklet is vital for microscopists occupied with nanoscale and fabrics microanalysis in particular these utilizing scanning transmission electron microscopy, and comparable analytical options reminiscent of electron diffraction x-ray spectrometry (EDXS) and electron strength loss spectroscopy (EELS).Content:
Chapter 1 basic advent to Transmission Electron Microscopy (TEM) (pages 1–19): Peter Goodhew
Chapter 2 advent to Electron Optics (pages 21–38): Gordon Tatlock
Chapter three improvement of STEM (pages 39–53): L. M. Brown
Chapter four Lens Aberrations: analysis and Correction (pages 55–87): Andrew Bleloch and Quentin Ramasse
Chapter five idea and Simulations of STEM Imaging (pages 89–110): Peter D. Nellist
Chapter 6 info of STEM (pages 111–161): Alan Craven
Chapter 7 Electron power Loss Spectrometry and effort Dispersive X?ray research (pages 163–210): Rik Brydson and Nicole Hondow
Chapter eight functions of Aberration?Corrected Scanning Transmission Electron Microscopy (pages 211–240): Mervyn D. Shannon
Chapter nine Aberration?Corrected Imaging in CTEM (pages 241–261): Sarah J. Haigh and Angus I. Kirkland

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Extra info for Aberration-Corrected Analytical Transmission Electron Microscopy

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6 and some examples are provided in Chapter 8. 5 REQUIREMENTS OF A SPECIMEN A specimen suitable for study by TEM should obviously be thin enough for electron transmission, and representative of the material about which we wish to draw conclusions. These simple requirements imply that in most cases we must prepare a thin specimen from a larger sample, and in all cases we must assure ourselves that the processes of preparation, mounting and examination do not change, in any uncontrolled way, the important features of the specimen.

The sum over all the different spherical waves – the Fresnel integral – can be treated in a graphical way using an amplitude-phase diagram in which the amplitude is represented by a distance in the xy plane and the phase is represented INTRODUCTION TO ELECTRON OPTICS 23 by angle. By plotting how the overall intensity changes as the waves are summed, it is possible, for example, to illustrate how the intensity changes in the vicinity of a sharp edge in the specimen. It is often marked by a small amount of intensity in the shadow of the edge and an oscillating intensity level close to the edge, which dies away with position away from the edge.

Alternatively, hollow cylinders of superconducting material can be included within a conventional lens to confine the magnetic flux into a particular configuration by screening. Other types of lenses sometimes found in electron microscopes include the mini-lens (Mulvey, 1974) which has a water cooled coil or snorkel lens with only a single pole piece. Small bores allow a reduction in focal length and spherical aberration coefficients. 5). In this case the magnetic field is perpendicular to the electron beam and a strong Lorentz force is exerted.

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Aberration-Corrected Analytical Transmission Electron Microscopy by Susan Brooks(eds.)

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